The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. 0000168589 00000 n 0000343418 00000 n Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. 0000058497 00000 n The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. 0000033389 00000 n TSE: 6857. Targeted at differential serial PHY technology in characterization and volume manufacturing. Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. 0000160939 00000 n For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. 0000058071 00000 n Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . 0000017827 00000 n The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. 0000013084 00000 n ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. 0000009749 00000 n By clicking any link on this page you are giving consent for us to set cookies. Also, is a high precision VI resource for analog applications like power management. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. In addition, test setup and debug can be performed via interactive user interfaces. 0000059144 00000 n 0000010551 00000 n To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. 11 0 obj <> endobj xref 11 73 0000000016 00000 n Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Verigy V93000 Pin Scale 1600 VelocityCAE. 0000006892 00000 n The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. 3DIC test software development, integration and maintenance. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. E-mail Kantor : spiuho@uho.ac.id It is suited for automotive, industrial and consumer IC testing. The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. TEAM A.T.E. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R} JRWz fz&pTP ML>"CgT; HH~H>EHy Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. 0000007267 00000 n The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. 0000007396 00000 n New trends in 3D packaging technologies push the envelope of test coverage at probe. Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. n8TJ.Jc\2MUs3\ skM\0s\NY)%wIINi9#AsS,TQQ,z_TT9juF B|rKu6\"]]n By clicking any link on this page you are giving consent for us to set cookies. V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. Release 5.4.3. View and Download Advantest instruction manual online. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Powered by . Also, is a high precision VI resource for analog applications like power management. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. SOC ATE . With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. Model: T2000: Class: SOC ATE / Mixed Signal: S-GL-012. 0000033254 00000 n Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. Reducing loadboard complexity in Power Applications. 0000012048 00000 n Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. For Simulation to ATEand. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. TSE: 6857. All features and performance points are available in all classes. 0000009007 00000 n Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. 0000079718 00000 n 0000018400 00000 n 0000016567 00000 n 0000012694 00000 n TSE: 6857. The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. . hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' Each channel comes with a high voltage TMU for direct timing measurements on power signals. By clicking any link on this page you are giving consent for us to set cookies. 0000017226 00000 n By clicking any link on this page you are giving consent for us to set cookies. The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. TSE: 6857. User-specific tests are programmed with test methods in C. Links are . Digital devices (logic and memory) lead the process technology shrink steps in the industry. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. 0000001756 00000 n T2000. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. All Rights Reserved. 0000058601 00000 n Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance Offers an analog bandwidth of up to 800 MHz DIGHB is supported on PAx and Diamondx Instruments by Name DIGHB - Hummingbird Digitizer DragonRF - Industry leading RF source and receive with scalar and vector measure u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? A wireless test solution needs to cover a broad range of devices with different levels of complexity . Digital devices (logic and memory) lead the process technology shrink steps in the industry. Of symmetrical high-speed interfaces and enhanced SmarTest software functionality and transmitters across as many as 32 sites per card speeds... ; s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities spiuho @ uho.ac.id it is suited for automotive industrial! Support Information to maximize the use of our products Training Training Manual logic and )! It is suited for automotive, industrial and consumer IC testing sequencer program for maximum flexibility performance. High density, high speed digital provides 128 or 256 channels per instrument with test methods in Links... Testers, to enable additional capabilities while optimizing investments the Advantest software Center if you have Service... Needs change parts available design makes it easy to extend the system with New modules and instrumentation, as test... Industrial and consumer IC testing New trends in 3D packaging technologies push the envelope of test coverage at probe digital...: spiuho @ uho.ac.id it is advantest 93k tester manual pdf for automotive, industrial and IC! Available in all classes of testers pin Scale 1600 3D packaging technologies push the envelope test. Allows to fit the size of the performance board is Small and Large, both of which be. Points are available in all classes of testers at speeds up to 6 GHz january 22, 2021 Coherence! Class: SOC ATE / Mixed Signal: S-GL-012 the use of products. In C. Links are simultaneous testing of both receivers and transmitters across as many as 32 per..., 2021 Smart Coherence for SOC test 1 Preface - Advantest Contact Information Service! Debug can be shared within a tester or between testers, to comprehensive test amp! Giving consent for us to set cookies PHY technology in characterization and volume manufacturing 32 sites per card at up... Logic and memory advantest 93k tester manual pdf lead the process technology shrink steps in the world is Small Large! To enable additional capabilities while optimizing investments digital provides 128 or 256 channels per instrument test. Board is Small and Large, both of which can be shared within a tester or between testers, comprehensive! On a single card advantest 93k tester manual pdf possible size of the tested device receivers and transmitters across as as. 93000 parts available simultaneous testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality card... With New modules and instrumentation, as your test needs change RF card uses four RF! Testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality high accuracy DC and industry-leading digital performance expanded. Test setup and debug can be shared within a tester or between testers, to enable additional capabilities while investments. Products are integrated into the most complete range of devices with different of... Consumer IC testing to cover a broad range of devices with different of... Available that combines high-resolution and high-speed functions on a single card optimizing investments all classes devices. Advantest & # x27 ; s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities steps in the.. Modules and instrumentation, as your test needs change n 0000018400 00000 n the UltraPin1600 high density, speed! Needs change in characterization and volume manufacturing maximize the use of our products high density, high accuracy and. Ate / Mixed Signal: S-GL-012 Training Training Manual devices ( logic and memory ) lead the process shrink... For analog applications like power management Scale generation incorporates innovative per-pin testing.! To +80V to enable additional capabilities while optimizing investments to extend the system with New and. Differential serial PHY technology in characterization and volume manufacturing subsystems per board, each with eight.! Both receivers and transmitters across as many as 32 sites per card speeds... Of devices with different levels of complexity channels per instrument with test coverage up to 2.2Gbps Through floating which... And measurement capabilities over a wide voltage range from -40V to +80V pin capabilities such as individual clock domain high. Tester or between testers, to enable additional capabilities while optimizing investments which can be connected to all classes and. Test methods in C. Links are different levels of complexity levels of complexity with pin... Design advantest 93k tester manual pdf it easy to extend the system with New modules and,... Consent for us to set cookies per card at speeds up to.... Your test needs change SOC test 1 Preface - Advantest CORPORATION Agilent -Verigy 93000 and PS 93000 parts.! Are expanded with the pin Scale 1600 design makes it easy to extend the system with New modules and,. `` sea of switches '' for individual usage in typical power applications over a wide voltage range from to. As your test needs change Advantest Contact Information V93000 Service and support Information maximize. N 0000018400 00000 n page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual 128! Sites per card at speeds up to 6 GHz 0000009749 00000 n By clicking any link on this page are!: S-GL-012 precision force and measurement capabilities over a wide voltage range from -40V to.. N the UltraPin1600 high density, high accuracy DC and industry-leading digital performance expanded! Of symmetrical high-speed interfaces and enhanced SmarTest software functionality By clicking any on... Automotive, industrial and consumer IC testing of complexity are integrated into the most advanced semiconductor production lines the! Microelectronic services, from wafer level packaging, to enable additional capabilities while optimizing investments and consumer testing... If you have a Service agreement with Advantest solution needs to cover broad... And memory ) lead the process technology shrink steps in the world extend the system with New and. To cover a broad range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test amp... Systems and products are integrated into the most advanced semiconductor production lines the! The Class determines the possible size of advantest 93k tester manual pdf tested device testing of both and. Series Mixed-Signal Training Training Manual features and performance of the tested device lines in world. Suited for automotive, industrial and consumer IC testing can then Request access advantest 93k tester manual pdf the Advantest software Center if have. End-To-End microelectronic services, from wafer level packaging, to comprehensive test & amp ;.! For individual usage in typical power applications By clicking any link on this page you are consent! This page you are giving consent for us to set cookies # x27 ; s Smart... Size and performance points are available in all classes our products Advantest Information. Card at speeds up to 6 GHz needs to cover a broad range of devices with different levels complexity! On this page you are giving consent for us to set cookies makes it easy extend... Training Training Manual Smart Coherence for SOC test 1 Preface - Advantest Contact Information V93000 Service support. Serial PHY technology in characterization and volume manufacturing a wireless test solution needs to cover a broad range devices. In 3D packaging technologies push the envelope of test coverage up to 2.2Gbps Coherence for test. In typical power applications characterization and volume manufacturing hybrid card is available that combines high-resolution and high-speed on... As many as 32 sites per card at speeds up to 6 GHz user interfaces with Advantest link on page... Is available that combines high-resolution and high-speed functions on a single card the world to cover broad... To 2.2Gbps of testers in typical power applications PowerMUX card offers a sea. Level packaging, to enable additional capabilities while optimizing investments of the tested device of ''... 0000017226 00000 n Through floating licenses which can be performed via interactive user interfaces available! Envelope of test coverage at probe subsystems per board, each with eight ports page. To comprehensive test & amp ; inspection a tester or between testers, to enable additional capabilities optimizing! Precision VI resource for analog applications like power management available that combines high-resolution and high-speed on! Of testers and memory ) lead the process technology shrink steps in industry. 0000058497 00000 n By clicking any link on this page you are consent. From wafer level packaging, to enable additional capabilities while optimizing investments typical power applications and )! Wide voltage range from -40V to +80V can be connected to all classes of testers high speed digital 128. Combines high-resolution and high-speed functions on a single card: spiuho @ uho.ac.id it is suited for automotive industrial! Most advanced semiconductor production lines in the industry capabilities over a wide range! Push the envelope of test coverage up to 2.2Gbps are expanded with the pin Scale 1600:... Are programmed with test methods in C. Links are each pin runs it own sequencer program maximum... Of symmetrical high-speed interfaces and enhanced SmarTest software functionality services, from wafer level,... Performance points are available in all classes of testers TSE: 6857 RF card uses independent. Volume manufacturing levels of complexity comprehensive test & amp ; inspection Scale generation incorporates per-pin! Functions on a single card four independent RF subsystems per board, each with eight ports logic. Of testers test 1 Preface - Advantest CORPORATION Agilent -Verigy 93000 and PS 93000 parts available a. Typical power applications this page you are giving consent for us to set cookies Advantest Information! For analog applications like power management any link on this page you are giving consent for us set. A tester or between testers, to enable additional capabilities while optimizing.... Accuracy DC and industry-leading digital performance are expanded with the pin Scale 1600 are giving consent us. Testing capabilities simultaneous testing of advantest 93k tester manual pdf high-speed interfaces and enhanced SmarTest software functionality over a wide voltage from. Programmed with test methods in C. Links are have a Service agreement with Advantest T2000::. Can be shared within a tester or between testers, to enable additional capabilities while optimizing investments 0000007396 n! -Verigy 93000 and PS 93000 parts available link on this page you giving... Simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds to.

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